The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1996
Filed:
Mar. 09, 1995
Shinya Nagashima, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
Each of beams originated from a light source to be measured and a white light source is branched by a beam splitter into two beams, which are reflected by a fixed and a movable mirrors respectively to meet each other again so as to generate interfering light, the white light being maximum in interfering efficiency when the optical path reaching the movable mirror is equal in length to that reaching the fixed mirror. The interfering light originated from the light source is converted into an electric signal by a first light receiver and further into pulses by a first converter. A length measuring machine outputs a pulse signal corresponding to the moving length of the movable mirror. A second light receiver converts the interfering light originated from the white light source into an electric signal. When it exceeds a set value, a second converter supplies an origin signal to the interfering light counting portion and the distance counting portion so that they start counting pulses and the position detecting portion outputs a position detecting signal when the movable mirror is moved for an arbitrary distance. A calculator calculates the wavelength of the light to be measured based on the counted values to display the result on a display. As a result, it is possible to provide an optical wavemeter which is increased in effective length of scale by permitting light originated from a white light source to be incident to an interferometer to find the position of the movable mirror where interfering efficiency is maximum and performing calibration as far as an arbitrary moving distance relative thereto.