The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1996
Filed:
Aug. 30, 1994
Applicant:
Inventors:
John R Kirtley, Katonah, NY (US);
Mark B Ketchen, Hadley, MA (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; H01L / ;
U.S. Cl.
CPC ...
324248 ; 324201 ; 505846 ; 327527 ;
Abstract
Improved probes for miniaturized scanning magnetometers (scanning microscopes), particularly those utilizing superconducting quantum interference devices (SQUIDs), are provided by the invention. The improved probes can have sub-.mu.m.sup.2 effective pickup loop areas and enhanced shielding through the use of progressively wider double groundplane structures which result in improved probes having high spatial resolution.
Kirtley, John. (1996). Probes for scanning squid magnetometers (U.S. Patent No. 5523686). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5523686
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile