The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1996
Filed:
Dec. 21, 1994
Applicant:
Inventors:
Chang-Feng Wan, Garland, TX (US);
Joseph D Luttmer, Richardson, TX (US);
Julie S England, Dallas, TX (US);
David E Fleming, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 22 ; 437-5 ; 437185 ; 148D / ;
Abstract
Channel stops for MIS infrared photodetector devices in Hg.sub.1-x Cd.sub.x Te by lattice damage (454) between and automatically aligned to MIS gates (408). Also, field plates and guard rings are automatically aligned to MIS gates.
Wan, Chang-Feng. (1996). Method of making infrared detector with channel stops (U.S. Patent No. 5523241). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5523241
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