The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1996
Filed:
Apr. 26, 1994
Nihon Kohden Corporation, Tokyo, JP;
Abstract
A method and apparatus is disclosed to reduce noise which overlaps detected signals in a common frequency band for detection of distributed signals from multiple measurement points. The method decomposes a input signal into a noise-free part called basic signal and a noise-overlapping part called residual signal. Noise contained in residual signal is recognized by comparing it with a comparison signal. The comparison signal corresponding to a measurement point is computed by a linear combination of all other points weighted with parameters which reflect amplitude relationship of distributed signals and are calculated during a learning phase at the beginning of measurement. With residual signal and corresponding comparison signal, a noise index is calculated and then used to extract signal components from the residual signal. The extracted signal components are added to basic signal as the output of the method. The method is effective in reducing signal-overlapping noise with little distortion of signal.