The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1996
Filed:
Sep. 02, 1993
William A Doolittle, Stockbridge, GA (US);
Ajeet Rohatgi, Marietta, GA (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
A computer-based deep level transient spectroscopy (DLTS) system (10) efficiently digitizes and analyzes capacitance and conductance transients acquired from a test material (13) by conventional DLTS methods as well as by several transient methods, including a covariance method of linear predictive modeling. A unique pseudo-logarithmic data storage scheme allows each transient to be tested at more than eleven different rates, permitting three to five decades of time constants .tau. to be observed during each thermal scan, thereby allowing high resolution of closely spaced defect energy levels. The system (10) comprises a sensor (12) for detecting capacitance and/or conductance transients, a digitizing mechanism (14) for digitizing the capacitance and/or conductance transients, preamplifiers (16a, 16b) for filtering, amplifying, and for forwarding the transients to the digitizing mechanism (14), a pulse generator (18) for supplying a filling pulse to the test material (13) in a cryostat (24), a trigger conditioner for coordinating the timing between the digitizing mechanism (14) and the pulse generator (18), and a temperature controller (26) for changing the temperature of the cryostat (24).