The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1996
Filed:
Nov. 15, 1994
Tadashi Kajino, Okazaki, JP;
Mikio Kurachi, Hazu-gun, JP;
Noritsugu Nozawa, Toyokawa, JP;
Masanao Fujieda, Toyohashi, JP;
Nidek Co., Ltd., , JP;
Abstract
The present invention provides a lens meter capable of accurately measuring the optical characteristics of a lens including additive diopter and of providing highly reliable data representing the optical characteristics of the lens. The lens meter projects measuring light through a target mark on a lens, focuses an image of the target mark in a target image on a photo-detecting device, and determines the optical characteristics of the lens on the basis of a locus of the target image detected by the photo-detecting device. The lens meter comprises an additive diopter measuring mode selector switch, a control means for shifting the lens to position measuring points distributed at predetermined intervals on the lens successively on a measuring optical axis and measuring the refractive power of the lens at each measuring point, a position detecting means for detecting the distance of each measuring point from a predetermined reference point, and a display means for displaying the relation between the distance of the measuring point from the reference point and the variation of the spherical refractive power of the lens.