The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 1996

Filed:

Feb. 04, 1994
Applicant:
Inventors:

Hiroshi Nishizato, Kumamoto, JP;

Visweswaren Sivaramakrishnan, Cupertino, CA (US);

Jun Zhao, Milpitas, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C / ; G01F / ; G01F / ;
U.S. Cl.
CPC ...
427-8 ; 4272481 ; 4272551 ; 73196 ; 73199 ; 7386142 ; 7386149 ;
Abstract

The flow of a liquid reagent gas into a vapor deposition process chamber is adjusted in response to control information provided by a process controller. The controller executes a prescribed mathematical algorithm which utilizes first and second steady-state pressure differentials. The first pressure differential is measured during the flowing of a carrier gas into the chamber. The second pressure differential is measured after the release of the liquid reagent into the chamber.


Find Patent Forward Citations

Nishizato, Hiroshi. (1996). Method for in-situ liquid flow rate estimation and verification (U.S. Patent No. 5520969). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5520969

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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