The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1996
Filed:
Apr. 01, 1994
Applicant:
Inventors:
Russell M Clinton, III, Humble, TX (US);
William P Jones, Baytown, TX (US);
Mark A Roffman, Crosby, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
236 / ; 374109 ;
Abstract
A method and apparatus for measuring and compensating for the impact of environmental effects on industrial processing units. A thermal test element having a low thermal mass and high conductivity is exposed to the environment. Ambient air temperature is sensed at a nearby location, and a differential temperature controller determines how much energy is required to maintain the test element at a desired temperature differential from ambient temperature. Duty cycle and wattage outputs enable feedforward compensation for environmentally induced process unit control disturbances.