The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1996
Filed:
Jun. 19, 1995
Applicant:
Inventors:
Ronald F Garritano, Flemington, NJ (US);
Michael Goncharko, Millstone, NJ (US);
Mahesh Padmanabhan, Piscataway, NJ (US);
Assignee:
Rheometric Scientific, Piscataway, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 5402 ; 73843 ; 374 46 ;
Abstract
Apparatus and method for the simultaneous measurement of rheological and thermal characteristics of a test specimen subjects the test specimen to stress for rheological measurements, while at the same time subjecting the same test specimen to controlled temperature changes for the measurement of temperature differentials indicative of thermal characteristics of the test specimen while the test specimen is being stressed for the rheological measurements, and a measuring cell for measuring the thermal characteristics of a specimen.