The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 1996

Filed:

Oct. 12, 1994
Applicant:
Inventor:

Edward C Gage, Fairport, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 4434 ; 369 4437 ; 369 4426 ;
Abstract

An apparatus and method for providing a sampled tracking error signal in an optical system using multiple illumination spots. An optical source generates radiation which is applied to a storage medium to produce a first illumination spot, a second illumination spot and a third illumination spot thereon. A return beam resulting from application of the radiation to the medium is detected, and a data signal is generated from the detected return beam. A sampled tracking error signal is generated from a first sample of the data signal, taken when the second spot illuminates a portion of a tracking mark, and a second sample of the data signal, taken when the third spot illuminates another portion of a tracking mark. The data signal samples may be normalized to samples of a source monitor signal. The data signal may be generated from magneto-optic, write-once, or other types of optical storage media.


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