The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 1996
Filed:
May. 11, 1994
Yannick DeVille, Villecresnes, FR;
U.S. Philips Corporation, New York, NY (US);
Abstract
An apparatus (5) for generating an approximation function based on first pairs ((X.sub.1, Y.sub.1) to (X.sub.6, Y.sub.6)) of values associating a dependent variable (Y.sub.1 to Y.sub.6) with an independent variable (X.sub.1 to X.sub.6), and for determining second pairs (X.sub.A, Y'.sub.A) of values of said variables in accordance with said approximation function. The apparatus comprises: a) first means (10) for iteratively determining at least one current linear regression function, for selecting that one of the current linear functions which produces the approximation of all the pairs of said series with minimal errors, and for coding the selected linear regression function with the aid of specific codes (p, q), and b) second means (17) for determining said second pairs (X.sub.A, Y'.sub.A) with the aid of said specific codes. The apparatus can also be used for calculating approximated values of mathematical functions, for example a in a neural network, or for determining a regression function forming an approximation to experimental measurement results, for example distributed measurements resulting from monitoring an industrial process. The invention also relates to a method of generating an approximation function.