The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 1996

Filed:

Jul. 25, 1994
Applicant:
Inventors:

Shigenori Nakata, Shizuoka, JP;

Shintaro Sato, Shizuoka, JP;

Seisaku Kamiya, Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356338 ; 356246 ; 359512 ;
Abstract

A particle counting device is improved to prevent adhesion impurities that result from condensation of condensation vapor on optical systems and the like in a particle detection area or the like of a measuring device to detect particles contained in the atmosphere or in certain gases and using condensation nuclei. In particular, in a particle measuring operation in which, in a chamber for saturated vapor that contains a liquid that can condense at a room temperature, a gas is added to a saturated vapor, the gas is introduced into a condensation part that is at a room temperature, the vapor is condensed on the particles as nuclei, and in which the particles, in a connected particle detection area, are measured, a heater is provided to keep the temperatures of the detection area, the connection pipe and the nozzle at least at a temperature higher than or equal to the temperature of the condensation part, to prevent adhesion impurities of condensation vapor on optical systems and the like in the detection area.


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