The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 1996

Filed:

Dec. 16, 1994
Applicant:
Inventor:

Tadaya Ishibashi, Amagasaki, JP;

Assignee:

Unitika Ltd., Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436163 ; 436147 ; 436150 ; 436151 ; 324439 ; 324441 ; 73 6146 ; 2057885 ;
Abstract

A method of determining the concentrations of at least two of plural kinds of known free acids and ions contained in a solution, wherein these known free acids and ions are known beforehand to be different from each other in temperature changes and conductivity changes which are to occur in response to a titrant. The method includes a step of generating a differential temperature curve and an electric conductivity curve, which are obtained from a thermometric titration and a conductometric titration respectively and are used complementarily so that an end point which is hardly ascertained by one method of titration may be ascertained by the other method.


Find Patent Forward Citations

Ishibashi, Tadaya. (1996). Method of analyzing washings for free acids and ions (U.S. Patent No. 5518933). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5518933

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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