The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 1996
Filed:
Nov. 16, 1994
Thomas M Burke, Bothell, WA (US);
James Mehi, Kirkland, WA (US);
Advanced Technology Laboratories, Inc., Bothell, WA (US);
Abstract
A method and apparatus are described for testing the integrity of an ultrasonic transducer probe or the ultrasound system connected to the probe. The elements of the transducer are pulsed at a time when the probe is not in contact with a patient and the surface of the probe lens is exposed to the open air. The channel electronics receives the echo signal returned from the lens-air interface and reverberations between this interface and the transducer. These signals are analyzed by a diagnostic processor coupled to the channel electronics for characteristics such as amplitude, time of echo reception, group delay, and other characteristics to determine the possible existence of problems such as faulty transducer elements or connections and problems in the system receive electronics. The diagnostic processor can adaptively adjust an operating characteristic of the system electronics such as gain or time delay to compensate for a detected out of tolerance condition.