The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1996

Filed:

Sep. 30, 1994
Applicant:
Inventors:

Robert Rust, Boise, ID (US);

Eugene A Roylance, Boise, ID (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
395110 ; 395150 ;
Abstract

An apparatus derives data to enable a fill action during operation of a print device along a scan line. The apparatus includes a processor which determines, for each of a sequence of contours of a glyph, point of intersection values between a scan line and the contours. The sequential point of intersection values indicate OFF-to-ON and ON-to-OFF transitions required of the print device. Sequential OFF-to-ON and ON-to-OFF transitions comprise a transition pair. The apparatus includes a memory comprising 2N storage positions for storage of N transition pairs. Comparator circuitry is coupled in parallel to the 2N storage positions. A controller operates the comparator circuitry to determine an order of all OFF-to-ON point of intersection values and an order of all ON-to-OFF point of intersection values in the 2N storage positions. Switch circuitry is responsive to the determined order of OFF-to-ON point of intersection values to re-order the OFF-to-ON point of intersection values in the 2N storage positions and is further responsive to the determined order of the ON-to-OFF point of intersection values to re-order the ON-to-OFF point intersection values in the 2N storage positions. Overlap regions are determined and transition pairs to be arranged so that overlap regions are ignored.


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