The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 1996
Filed:
Sep. 23, 1994
Robert G Baker, Delray Beach, FL (US);
Paul R Swingle, Delray Beach, FL (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and computer implementation are disclosed for correcting skew and shift which may occur as the image on a document or other field is scanned with line scanning apparatus. By selecting scans, lines are logically overlaid upon a memory map of the scanned image and a best-fit line is calculated through left-most image points near the left ends of the lines. The best-fit line substantially defines the left margin. The angle which complements the angle between the overlay lines and the best-fit line is calculated and the image map is rotated in storage, aligning the image with scanner's x-axis and y-axis. The method may be started while scanning is still in progress and the last portion of the image may be rotated according to the invention as it is being stored. The left margin is more accurately found by expanding the search for left-most pixels using search areas around the fit originally found left-most points. The best-fit line is further refined by calculating a standard deviation of each left-most point from the best-fit line and taking a new best-fit line through those points that deviate by less than for example two sigma from the original best-fit line.