The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 1996
Filed:
Oct. 13, 1993
Applicant:
Inventor:
Theodore B Ladewski, Ann Arbor, MI (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382108 ; 382309 ; 356371 ; 356394 ;
Abstract
Methods of correcting optically generated errors in images formed of test object surface profiles include the use of a bias image to correct errors resulting from problems associated with components of the gauging system. The bias image is also useful for correcting errors resulting from the nature of the test object surface. Further methods also include the use of a mask to selectively vary the amount of radiation that is used across the test object surface when gauging the surface profile. The mask effectively uniformly irradiates the test object surface to correct errors caused by irregular or extreme surface contours or coloration in the test object surface.