The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 1996
Filed:
May. 24, 1994
Akihiro Takeuchi, Anjou, JP;
Tetsuhiko Nomura, Toyota, JP;
Kazuhito Shibata, Aichi, JP;
Toshihiko Tsukada, Aichi, JP;
Osamu Ozeki, Nagoya, JP;
Shin Yamamoto, Nagoya, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Abstract
A 3D volume measuring apparatus using an optical measuring technique performs an accurate measurement by using a common master clock signal to move a slit beam and to perform a measuring operation using the slit beam. An optical sensor has a slit beam source which projects the slit beam onto a surface of an object. A video camera receives an image of the optical cutting line. A master clock pulse generating unit is provided for generating master clock pulses. The slit beam is scanned on the object in synchronization with the master clock pulses. Information of the image of the optical cutting line is obtained in synchronization with the master clock pulses, so that the contour of the vertical section corresponding to the optical cutting line is obtained. A chamber volume correcting method using the 3D volume measuring apparatus is provided in which method an exact cutting depth for a cylinder head can be calculated so that a chamber of the cylinder head has an exact target volume. The cutting depth is determined in accordance with the measured volume of the chamber before a finish machining is performed.