The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1996

Filed:

Mar. 08, 1993
Applicant:
Inventors:

James H Cole, Great Falls, VA (US);

Daniel F Mathus, Vienna, VA (US);

Assignee:

Dylor Corporation, Ligonier, PA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 356358 ; 25022719 ;
Abstract

A fiber optic interferometric sensor system utilizing a reference transducer and an optical source having a short coherence length in comparison to the optical transit time through the sensor. The optical source is used to interrogate a remotely located fiber optics sensor which has an optical path difference between two reflecting surfaces or between one reflecting surface and a beam transmitted through the sensor such that the optical beams are incoherent for the optical source used. The reflected and transmitted beams are then coupled to a reference transducer, located remotely from the sensor and preferably near the electronic processing circuitry. The reference transducer is designed with an optical path length difference to produce a coherent combination for the optical path length differences of both the sensor and the reference transducer thereby forming a highly sensitive interferometer.


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