The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1996

Filed:

Mar. 17, 1994
Applicant:
Inventors:

Tatsuo Teratani, Aichi, JP;

Yasuo Mishima, Hekinan, JP;

Tsuyoshi Katayama, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C / ;
U.S. Cl.
CPC ...
356 71 ; 356394 ;
Abstract

A key plate examination apparatus and examination method whereby the form of an examined key plate can be recognized accurately and form information of a reference key plate can be compared with the recognized key plate form to determine their conformity rapidly. The form of the examined key plate is recognized by form recognition means, and form information is generated by form information generation means in response to the recognized form of the examined key plate. On the other hand, form information of the key number corresponding to a key number input externally is retrieved by key number retrieval means from a key information memory means storing the key number proper to the reference key plate and its corresponding form information. The form information generated by the form information generation means is compared with the form information retrieved by the key number retrieval means to determine their conformity by determination means. The operator is informed of the determination result of the determination means by communication means.


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