The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 1996
Filed:
Apr. 19, 1994
Applicant:
Inventors:
Ronald J Weinstock, Westlake Village, CA (US);
Sigrid Lipsett, Westlake Village, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324312 ; 324322 ;
Abstract
The magnetic resonance signal analyzer allows to automatically generate a large variety of test signals including one or more frequencies. The test signals can be applied as electromagnetic fields or as currents to material under test. An electromagnetic or electrical response signal of the material under test be applied to the analyzer for processing to determine the response pattern of the material under test and then returned to the automatic controller of the frequency sources. The automatic controller determines the test signal with the most effective response for the particular matter under test.