The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1996

Filed:

May. 03, 1994
Applicant:
Inventors:

Wojtek J Bock, Gloucester, CA;

Waclaw Urbanczyk, Wroclaw, PL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
25022717 ; 25023119 ; 250225 ; 356351 ; 356-1 ;
Abstract

An apparatus and a method are provided for measuring an ambient physical parameter applied to a highly birefringent sensing fiber. A light source emits a low coherence light beam into a sensing fiber subjected to an ambient physical parameter. A collector receives the output light beam of the sensing fiber and a splitter divides the output light beam into two orthogonally polarized output beams and subjects the two orthogonally polarized output beams to a range of relative delays. A recombiner combines the two orthogonally polarized output beams to produce an interference pattern, and a detector detects intensities of the interference pattern over the range of delays. A calculating device determines the ambient parameter from the intensities with improved accuracy.


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