The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1996

Filed:

Sep. 06, 1991
Applicant:
Inventor:

Yuuichi Osano, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382300 ; 358428 ;
Abstract

Sampled points are connected by lines to form a line pattern which may have a steady portion and a suddenly changing portion. Various line patterns are classified into several classes depending on rates of change of slopes of the line patterns. When a line pattern transits from the steady portion to the suddenly changing portion, or vice versa, before or after a sampled point, the differential coefficient of an interpolation curve at the sampling point is made closer to the slope in the steady portion. Sampled signals having sudden transitions can thereby be interpolated without undue fluctuations before and after the transitions.


Find Patent Forward Citations

Osano, Yuuichi. (1996). Apparatus and method for interpolating sampled signals (U.S. Patent No. 5515457). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5515457

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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