The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1996

Filed:

Oct. 11, 1994
Applicant:
Inventors:

Masao Futamura, Nagoya, JP;

Mitsuyasu Kyuno, Ama, JP;

Yukiyoshi Muto, Nagoya, JP;

Masahiro Mizuno, Kasugai, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
364470 ; 11247006 ; 11247004 ; 11247519 ;
Abstract

A stitch data producing system scans an original pattern by an image scanner to acquire image data and segments the original pattern into a plurality of embroidering regions and determines distances from the periphery of a set of pixels included in each embroidering region to each of the pixels, i.e., the depths of the pixels by a CPU. The stitch data producing system produces stitch data suitable for embroidering a comparatively large, substantially circular embroidering region when the sum of the distances is large and produces stitch data suitable for embroidering an elongate embroidering region when the sum of the distances is small. Thus, the stitch data producing system automatically produces stitch data for carrying out a stitching method, such as a satin stitching method, a fill stitching method, a running stitching method or such, suitable for embroidering each embroidering region.


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