The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 1996
Filed:
Oct. 13, 1993
Robert L Cargill, San Jose, CA (US);
Erich Gombocz, Menlo Park, CA (US);
Claudio I Zanelli, Sunnyvale, CA (US);
Basil Swaby, Santa Rosa, CA (US);
Labintelligence Inc., Menlo Park, CA (US);
Optical Coating Laboratory, Inc., Santa Rosa, CA (US);
Abstract
A spectral wavelength discrimination system and method for using are provided which allows the wavelength of a beam of radiation to be accurately determined using compact inexpensive optics and electronics. The system is particularly useful for identifying the emission wavelength of a multi-component marker system which includes a plurality of components having different wavelength ranges. The system comprises a wavelength selective beamsplitter, termed a Linear Wavelength Filter, that directs predetermined fractions of the beam at each wavelength into each of two output beams. The intensities of these output beams are measured. The measurements and selected system parameters, including the beamsplitter spectral characteristics and the detector sensitivity characteristics are used in a special algorithm for performing Fourier based wavelength-dispersive analysis. The unique solution of the Fourier based analysis is the wavelength of the beam of radiation. The system employs various optical components and structures to achieve the desired spatial resolution and sensitivity. Multiple channel devices and other special configurations are also described.