The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1996

Filed:

Sep. 01, 1994
Applicant:
Inventors:

Vladimir Kupershmidt, Pleasanton, CA (US);

Mikhail Kouchnir, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356338 ; 356339 ; 356369 ;
Abstract

A method and an apparatus for the analysis of particles contained in a material, such as particles in a fluid or on a surface, such as the surface of a semiconductor, by two orthogonally polarized, intensity and phase modulated laser beams, wherein the detected scattered light is synchronously demodulated. The apparatus comprises a laser source producing a polarized laser beam, a state of polarization modulator, and a photoreceiver for detecting light scattered by particles at an angle to the incident light. A synchronous demodulator, such as a dual channel lock-in amplifier, separates the intensity and phase modulated portions of the scattered signals. A reference unit for detecting a non-scattered light produced by the sample to provide a reference is preferably provided, as well. The size, index of refraction and identity, of the particles, for example, can be determined.


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