The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1996

Filed:

Jun. 14, 1993
Applicant:
Inventors:

Nicolas Vezard, Metuchen, NJ (US);

Francis J Purcell, Westfield, NJ (US);

Assignee:

Instruments SA, Inc., Edison, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
356318 ; 356334 ; 2504581 ;
Abstract

In accordance with the present invention, a low noise light source for illuminating a treated or untreated deposition of material for forensic examination is disclosed. A light having a wide range of wavelengths is generated. The light is directed toward a reflective diffraction grating. The relative position between an exit slit and the grating is repeatedly adjusted to result in passage through the exit slit of different desired bands of wavelengths of output light from portions of the light reflected by the grating. The output light is directed through a filter, toward the deposition to be examined. The filter has a pass characteristic which substantially passes the desired bands and blocks the light that has a wavelength in an expected range of fluorescence of the deposition.


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