The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1996
Filed:
Jun. 30, 1994
Applicant:
Inventors:
Sujit Dey, Plainsboro, NJ (US);
Miodrag Potkonjak, Plainsboro, NJ (US);
Assignee:
NEC USA, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364489 ; 364488 ; 364490 ; 371 22 ;
Abstract
Non-scan design-for-testability methods for making register-transfer-level data path circuits testable include using EXU S-graph representation of the circuits. Loops in the EXU S-graph are made k-level controllable/observable to render the circuit testable without having to scan any flip-flops or break loops directly. Moreover, the resultant circuit is testable at-speed.