The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1996
Filed:
Aug. 12, 1994
Amir A Naqwi, Shoreview, MN (US);
Leslie M Jenson, Vadnais Heights, MN (US);
TSI Incorporated, St. Paul, MN (US);
Abstract
An interferometric system for measuring cross-sectional dimensions of glass fibers and other elongate objects includes: a transmitting optics module for generating two laser beams, and causing the laser beams to intersect and interfere with one another over a measuring volume; several photodetectors to collect the light scattered by the glass fiber positioned in the interference region; and signal processing circuitry to deduce the fiber diameter using phase shifts between the signal pairs and fiber velocity using the frequency of the signals. The system further offers: elimination of the 360.degree. limitation on the product of sensitivity (degrees per micron) and range (microns), accompanied by an increase in accuracy using three or more detectors; uniform sensitivity over a large measuring volume, using fringe flare to compensate for changes in the effective angular separation of the detectors, due to fiber displacement within the measuring volume; and insensitivity to fiber tilt using large-area detectors for receiving the light scattered by the fiber.