The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1996
Filed:
Sep. 15, 1994
Robert T Gibson, Snohomish, WA (US);
Paul H Heydron, Lynnwood, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Methods and apparatus are disclosed for using current detection in a test instrument to ensure validity of component test output. In a component test instrument that employs digital synthesis of a test stimulus waveform, voltage scan data and current scan data are successively acquired, the scan data being synchronized relative to the test stimulus waveform. The voltage and current scan data are stored in respective temporary storage buffers. Before displaying the data, a check for an open lead is conducted in a manner similar to a current scan. A zero current value indicates an open lead and the acquired scan data is disqualified from being displayed. Similarly, at the beginning of a component test operation, an open lead test is performed and the first voltage scan is deferred until a validity check confirms that the test leads or probes are in place. The disclosed methods and apparatus ensure that only valid data is displayed to the user.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile