The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1996
Filed:
Mar. 09, 1994
Jeffrey Finer, Palo Alto, CA (US);
Robert Simmons, Middlesex, GB;
James A Spudich, Palo Alto, CA (US);
Steven Chu, Stanford, CA (US);
Board of Trustees of the Leland Stanford Jr. University, Palo Alto, CA (US);
Abstract
By providing a focal region of light onto a particle, a laser-based light source can provide enough radiation pressure to position the particle at any desired location in space. In one application, the particle can be a micrometer-sized bead, called a handle, attached to a sample. When the sample under examination, such as an actin filament, interacts with other molecules, such as myosin, the forces generated may displace the sample, and thus the handle, out of its original position. To correct for the off-target position (or in other words, to increase the stiffness of the handle), a feedback loop that utilizes a quadrant photodiode detector and a focal region location means such as an acousto-optic modulator or galvanometer mirror is incorporated in the optical trap system. Use of two other light sources for brightfield illumination and epifluorescence allows the simultaneous viewing of the sample in real time. In other embodiments, the optical trap system can trap and manipulate particles.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile