The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 1996

Filed:

May. 27, 1994
Applicant:
Inventor:

Mathias P Welker, Toledo, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C03B / ;
U.S. Cl.
CPC ...
65 2918 ; 65 2912 ; 65158 ; 65160 ; 73 / ; 73 / ;
Abstract

A test apparatus for measuring operating characteristics of a position sensor coupled to a parison mold plunger for glass gob weight control in a press-and-blow individual section glassware manufacturing machine includes circuitry for connection to the sensor to provide a signal as a function of electrical characteristics thereof, a switch network for selecting among a plurality of differing electrical characteristics to be measured, and a display responsive to the sensor signal for displaying the selected and measured electrical characteristic of the sensor to an operator. The measurement circuitry includes a measurement bridge for measuring resistance characteristics of the sensor, and an amplifier circuit for measuring sensor output as a function of position of the plunger. The switch network selectively connects the sensor signal to the measurement bridge and amplifier circuit in differing modes of operation of the test apparatus.


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