The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 1996
Filed:
Apr. 19, 1995
Donna C Hurley, Albany, NY (US);
Robert S Gilmore, Burnt Hills, NY (US);
John D Young, Rexford, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
An eddy current surface inspection array probe and method for detecting cracks and flaws in aircraft skin metal immediately surrounding rivets, without requiring rivet removal or manual scanning. The array probe includes a circular array of small sense coils positioned beneath a much larger drive coil encased in ferrite. The sense coils are differentially connected in pairs such that the signals from two sense coils located on opposite sides of the rivet (180.degree. apart) subtract to produce a resultant output signal. During operation, the probe is positioned concentrically over the rivet and data acquired from all sense coil pairs. If no cracks or other defects are present, all sense coil pairs produce a null (zero) signal. If a crack exists, some sense coil pairs (the exact number depending on the crack length, number of sense coils, and sense coil spacing) produce a non-zero signal. The probe and method can be employed to inspect a variety of other structural features which are nominally circularly symmetrical.