The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 1996

Filed:

May. 27, 1993
Applicant:
Inventors:

Yukie Inoue, Tsuzuki, JP;

Ryuzo Hayashi, Higashiosaka, JP;

Naoka Matsuya, Sakai, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; G01N / ;
U.S. Cl.
CPC ...
435 26 ; 435-4 ; 435 28 ; 435 39 ; 435139 ; 435174 ; 435175 ; 435810 ; 435973 ; 435975 ; 4352861 ; 4352871 ; 4352865 ; 422 61 ; 422 681 ; 422 82 ; 422 8201 ; 422 8205 ; 422102 ;
Abstract

A method, apparatus and kit for assaying the L- and D-optical isomers and optionally the oxidation product derived from a L- (or D-) optical isomer.


Find Patent Forward Citations

Inoue, Yukie. (1996). Apparatus and method for assaying optical isomers (U.S. Patent No. 5510244). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5510244

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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