The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 1996
Filed:
Jun. 06, 1994
Applicant:
Inventors:
Subhashis Mallick, Missouri City, TX (US);
Ronald E Chambers, Houston, TX (US);
Alfonso Gonzalez, Sugarland, TX (US);
Assignee:
Western Atlas International, Inc., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
367 38 ; 367 56 ; 364421 ;
Abstract
A method for measuring the principal axis of fracture-induced formation anisotropy. Amplitude vectors are measured from CMP gathers oriented along in-line and cross-line wavefield trajectories. The amplitude vectors are resolved with the known orientations of the seismic lines of survey to estimate the azimuth of the anisotropic axis.
Mallick, Subhashis. (1996). Method for determining the principal axes of azimuthal anisotropy from (U.S. Patent No. 5508973). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5508973
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile