The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 1996

Filed:

Oct. 17, 1994
Applicant:
Inventors:

Yoshiaki Mizoh, Neyagawa, JP;

Hiroshi Yohda, Hirakata, JP;

Hidetoshi Kotera, Toyonaka, JP;

Hiromi Kita, Kashihara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364563 ; 364560 ; 36013024 ;
Abstract

A levitation phenomenon analyzer includes: a data input portion for reading data on fluid and structural components and minute structures of a device; a levitation analysis portion for solving basic simultaneous equations of the fluid and the structural components on the basis of the data; and a result output portion for outputting analytical results of the levitation analysis portion; wherein by regarding a flow path of the fluid for levitation analysis as a mean thickness of a air film or regarding the pressure of the fluid as a mean pressure, shapes of the minute structures which are independent of coordinates of nodal points are handled.


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