The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 1996
Filed:
Mar. 28, 1994
Applicant:
Inventor:
Norbert Furstenau, Braunschweig, DE;
Assignee:
Deutsche Forschungsanstatt fur Luft- und Raumfahrt e.V., Cologne, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 256 355 ;
Abstract
An interferometer strain sensor or gauge comprises a laser diode coupled to an interferometer with an opto-electric output converter, the output of which is supplied via a differentiating unit to an interference-fringe counter and via a feedback amplifier to the current supply of the laser diode to vary the wavelength thereof, the interference signal being in the form of a saw-tooth pattern with steep edges to produce rapid transitions for the differentiating unit.