The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 1996

Filed:

Feb. 23, 1994
Applicant:
Inventors:

Koji Kobayashi, Chofu, JP;

Hiroki Matsui, Chofu, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351221 ; 351205 ; 351216 ;
Abstract

An ophthalmic examination apparatus for scanning, imaging and observing the fundus of the eye comprises an optical system including a first laser source and a laser scanner, a base unit containing a synchronizing circuit for the laser scanner and a video monitor, an image processing unit, and a second laser light source unit detachably connectable to the optical system unit and optically connected with the scanning optical system through an optical fiber. An optional auxiliary optical system unit is provided for attachment to the optical system to observe the anterior chamber as well as the fundus of the eye. An optical device is incorporated to control the direction of light propagation generated by the second laser light source unit. The ophthalmic examination apparatus facilitates a diverse range of user needs, simplifies maintenance and transport and permits the configuration of an economical ophthalmological device to be configured.


Find Patent Forward Citations

Kobayashi, Koji. (1996). Ophthalmic examination apparatus for scanning, imaging and observing the (U.S. Patent No. 5508760). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5508760

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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