The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1996
Filed:
Feb. 24, 1992
William F Carlsen, Woodside, CA (US);
Tad D Simons, Palo Alto, CA (US);
Richard J Pittaro, San Carlos, CA (US);
George W Hopkins, II, Sunnyvale, CA (US);
Damien F Gray, Mountain Veiw, CA (US);
Hewlett Packard Company, Palo Alto, CA (US);
Abstract
A System for Collecting Weakly Scattered Electromagnetic Radiation is disclosed. The present invention overcomes problems suffered by previous collection systems by providing a reliable and efficient device for intensifying and collecting the scattered radiation generated by laser induced scattering. The present invention employs a laser source which illuminates an unknown gas contained by a long hollow tube having a highly reflective sheathing. The illuminating electromagnetic radiation from the laser is directed along the entire length of the tube and collides with the molecules of the unknown gas in the tube. The collisions cause the emission of weakly scattered electromagnetic radiation that is shifted in reference to the illuminating radiation. The sheathing is sufficiently reflective of the scattered radiation to substantially contain it. An exit is coupled to the long hollow tube in such a way that the scattered radiation may pass from the reflective sheathing and be collected for analysis. The scattered radiation that is collected may be used in conjunction with conventional spectrometry devices to provide a reliable and rapid determination of the composition and concentration of a wide range unknown gasses. The system may also be used to analyze a wide range of other scattering medium.