The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1996
Filed:
Mar. 11, 1994
Marco A Lopez, Villa Park, CA (US);
Thomas E Godfrey, Orange, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A method of testing a laser target designator, in which an aperture in the field of view of the laser target designator has one side facing the target image detector and the laser, a beam image detector faces an opposite side of the aperture and is aligned with the opening thereof so that the beam optical axis and the opposite side of the aperture are in a field of view of the beam image detector, both sides of the aperture being illuminated, and beam video processor obtains a test video image from the beam image detector and computes a centroid of the aperture in the test video image and a centroid of the laser beam in the test video image, the displacement of these centroids being a measure of the static error while relative movement of them during dithering of the optical path from the laser target designator is a measure of the dynamic error.