The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1996
Filed:
Nov. 01, 1994
Tokihiro Kosaka, Kakogawa, JP;
Kaoru Takarada, Miki, JP;
Toa Medical Electronics Co., Ltd., Hyogo, JP;
Abstract
A particle analyzer includes a flow cell for enclosing an electrolyte flow containing particles in a sheathed flow, the flow cell including a first and second cells which are interconnected through an orifice, the sheathed flow flowing through the orifice from the first cell to the second cell, a first and second electrodes provided in the first and second cells, respectively and a voltage application device for applying voltage between the first and second electrodes. The particle analyzer further includes a resistance detection device for detecting a variation of electric resistance between the first and second electrodes when the particle passes through the orifice to output the detected variation as a resistance detection signal. A first diameter calculation device is included for calculating each diameter of the particles based on the detected variation of electric resistance. Further a light source device for emitting a light beam to the particles enclosed in the sheathed flow and a light detection device for detecting each intensity of scatter light of the particles irradiated with the light beam to output the detected intensity as a scatter light detection signal are included. Finally, the particle analyzer includes a refractive index calculation device for calculating a refractive index of the particle based on the resistance detection signal and the scatter light detection signal and a second diameter calculation device for calculating each diameter of the particles based on the calculated refractive index and the scatter light detection signal.