The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1996
Filed:
Apr. 22, 1994
John K Krause, Westerville, OH (US);
Victor Wang, Westerville, OH (US);
Bradley C Dodrill, Westerville, OH (US);
Lake Shore Cryotronics, Inc., Westerville, OH (US);
Abstract
A coil arrangement having a primary and two balanced secondaries is used to measure ac susceptibility and, using sample movement, also to perform absolute dc moment measurements. Since the same coil arrangement is used for both AC and DC measurements, the measurements can be made successively within a cryogenic chamber without removing the sample. This is a big advantage, because the changed conditions associated with removing and replacing a sample between measurements can cause confusing, uncorrelated results. A high speed voltmeter is used to perform the signal analysis for the moment measurement. The system can be configured to yield high resolution dc moment measurements to 25 ppm and sensitivities to better than 5.times.10.sup.-5 emu.