The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 1996

Filed:

Jun. 15, 1994
Applicant:
Inventor:

Keiji Ohsawa, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
2502018 ; 2502081 ; 250204 ; 354402 ; 354404 ;
Abstract

A focus detection device is provided that can quickly detect small displacements with high precision in the optical image on arrays of photosensitive elements. The device includes a pair of arrays of photosensitive elements made of rectangular photosensitive elements arranged in a single line and positioned so that the boundary lines D between adjacent photosensitive elements are orthogonal to the direction in which the photosensitive elements are aligned. The boundary lines D are also inclined at a preset angle from the direction corresponding to vertical or horizontal lines in the image field. When the arrays of photosensitive elements and components peripheral to these arrays are solidly attached to a rectangular substrate, the arrays of photosensitive elements are positioned so that the direction in which the photosensitive elements are aligned is parallel to the sides of the perimeter of the substrate. Furthermore, the substrate is positioned so that the sides are inclined at a preset angle from the direction corresponding to vertical or horizontal lines in the image field.


Find Patent Forward Citations

Loading…