The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 1996

Filed:

Nov. 15, 1994
Applicant:
Inventor:

Boris Oreper, Newton, MA (US);

Assignee:

Tekscan, Inc., South Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ; G01L / ; G01L / ;
U.S. Cl.
CPC ...
73 / ; 73 / ; 73719 ; 73862045 ; 73862046 ; 36457105 ;
Abstract

A scanning circuit for an array of pressure responsive sensor points which permits the sensitivity of the circuit to be controlled. In particular, the sensitivity of the circuit may be controlled by controlling a test and/or reference voltage used with the circuit and different sensitivity or resolutions may be provided for different areas of the array. The circuit also provides enhanced interelectrode isolation, permitting a single test voltage to be utilized to scan all sensor points on a given input electrode and further reduces the time required to scan the array by reducing trace capacitance discharge time and by inhibiting processing for sensor points which are not of interest. The accuracy of pressures being sensed is also enhanced by adjusting the test voltage to compensate for load variations.


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