The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 1996

Filed:

Jul. 14, 1995
Applicant:
Inventors:

Jan Lonnqvist, Espoo, FI;

Horst Huttmann, Uetersen, DE;

Assignee:

Vaisala Oy, Helsinki, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356342 ; 356-506 ; 342 26 ;
Abstract

The invention concerns a method and device for measuring the meteorological visibility and the scattering of light. A light pulse is emitted into the atmosphere via an optical transmit system, the backscattered light returns via the optical transmit system after which its intensity and delay are measured. The waveform of the optical transmit pulse generated at the instant of its launching from within the apparatus is sensed in a manner that excludes any backscattered light originating from outside the measurement system, this signal is scaled for both its magnitude and phase so as to achieve a suitable feedback signal relative to the actual measurement signal and said feedback signal is subtracted from said measurement signal to avoid overloading of the receiver.


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