The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 1996
Filed:
Apr. 19, 1994
Masumi Okutsu, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A testing socket apparatus is provided for testing a plurality of different kinds of semiconductors without deformation of their leads. The testing socket apparatus includes a movable base which is movable up and down above a base and a loading portion which is substantially centrally provided on the movable base and on which the semiconductor device is loaded. A tip end of each of testers extends upwardly from a periphery of the loading portion. The tip end of each of the testers is brought into contact with an outer surface of the associated lead by lowering the movable base. The testers may be provided through guide holes formed in the movable base or may be biased toward the loading portion. Also, each of the testers may be formed substantially in L-shape to provide a pivot point at its corner whereby movement about the pivot point brings the testers into contact with the outer surface of the leads.