The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 1996
Filed:
May. 18, 1994
Masaru Noguchi, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A spectrofluorometric apparatus for obtaining spectral image information comprises a stimulating ray source, which produces a laser beam serving as stimulating rays, and a scanning device, which deflects the laser beam in two directions and causes the deflected laser beam to scan a sample. An optical system separates the fluorescence, which has been produced by the sample when the sample is exposed to the laser beam, from the optical path of the laser beam. A Fourier spectrometric system causes interference to occur with the fluorescence, which has been separated by the optical system from the optical path of the laser beam. The Fourier spectrometric system detects the brightness and darkness of the fluorescence, which are due to the interference, as a detection signal and carries out Fourier transformation on the detection signal. The spectrum of the fluorescence is thus measured for each point on the sample, and two-dimensional spectral image information of the sample is thereby obtained.