The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 1996
Filed:
Feb. 04, 1993
Gaston Baudat, Geneve, CH;
Christian Voser, Geneve, CH;
Mars Incorporated, McLean, VA (US);
Abstract
For the classification of a pattern in particular on a banknote or a coin, a receiving system detects, by a measurement procedure, vectors of a test item, a pre-processing system transforms the measured vectors into local feature vectors ALCi(l) and a learning classification system carries out a plurality of testing operations. A first activity compares in a first testing operation each of the local feature vectors ALCi(l) to a vectorial reference value. It is only if the first testing operation takes place successfully that the first activity, by means of first estimates which are stored in a data base, links the local feature vectors ALC(l) to provided global line feature vectors AGIi. In a second testing operation a third activity compares the global line feature vectors AGIi to corresponding reference values and, if the second testing operation is successful, computes a single global surface vector AGF of which a fourth activity, in a third testing operation, compares its distance in accordance with Mahalanobis relative to an estimated surface vector to a reference value. The test item is reliably clasified if all three testing operations take place successfully.