The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 1996
Filed:
Jun. 10, 1994
Applicant:
Inventors:
Rabindra K Roy, Plainsboro, NJ (US);
Toshinobu Ono, Yokohama, JP;
Assignees:
NEC USA, Inc., Princeton, NJ (US);
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
371 223 ; 371 221 ; 39518306 ; 364488 ; 364489 ;
Abstract
A method of selecting circuit elements in a sequential circuit for partial scan testing relies upon analyzing and breaking reconvergence through the selected circuit element. Different types of reconvergences present in the circuit and their affect on the circuit testability are considered. Harmful reconvergence present in the circuit are broken by scanning a memory element present in the reconvergence path.
Roy, Rabindra. (1996). Partial scan testability utilizing reconvergence through sequential (U.S. Patent No. 5502730). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5502730
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile