The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 1996
Filed:
Aug. 05, 1994
Rudolf Stettner, Trostberg, DE;
Kurt Feichtinger, Palling, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A calibration method of determining and compensating differences of measuring forces in different coordinate directions in a measuring scanning system for use in a numerically controlled multi-coordinate measuring machine, which method includes the steps of inputting parameters of the scanning system and of a calibration gauge into a control unit of the multi-coordinate measuring machine, scanning calibrating surfaces of the calibrating gauge with the scanning system, with a scanning displacement being effected in a direction defined by two coordinate directions, superimposing on the initial scanning displacement another scanning displacement, which deviates from the initial displacement, and determining deviation displacement paths of the scanning system for determining differences of the measuring force in different coordinate directions and respective correction coefficients, which are inputted into the control unit of the coordinate measuring machine.